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B51-14 (R2019) – Boiler, pressure vessel, and pressure piping code

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ISO 24688:2022

ISO 24688:2022 Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods

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Description

This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).

Edition

1

Published Date

2022-07-22

Status

PUBLISHED

Pages

8

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).

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