ISO 15625:2014
ISO 15625:2014 Silk – Electronic test method for defects and evenness of raw silk
CDN $173.00
Description
ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
Edition
1
Published Date
2014-04-29
Status
PUBLISHED
Pages
15
Language
English
Format
Secure PDF
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Abstract
ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
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