ISO 24173:2024
ISO 24173:2024 Microbeam analysis – Guidelines for orientation measurement using electron backscatter diffraction
CDN $352.00
Description
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
Edition
2
Published Date
2024-02-09
Status
PUBLISHED
Pages
40
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 10110:2019 Optics and photonics – Preparation of drawings for optical elements and systems – Part 1: General
CDN $352.00 Add to cart -
ISO 80004:2020 Nanotechnologies – Vocabulary – Part 3: Carbon nano-objects
CDN $86.00 Add to cart -
ISO 4006:1991 Measurement of fluid flow in closed conduits – Vocabulary and symbols
CDN $397.00 Add to cart -
ISO 2574:1994 Aircraft – Electrical cables – Identification marking
CDN $131.00 Add to cart
