ISO 23201:2015
ISO 23201:2015 Aluminium oxide primarily used for production of aluminium – Determination of trace elements – Wavelength dispersive X-ray fluorescence spectrometric method
CDN $295.00
Description
ISO 23201:2015 sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These elements are expressed as the oxides Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3, K2O, CuO, Cr2O3, and NiO on an un-dried sample basis. The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is also given.
Edition
1
Published Date
2015-11-16
Status
PUBLISHED
Pages
32
Language
English
Format
Secure PDF
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Abstract
ISO 23201:2015 sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These elements are expressed as the oxides Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3, K2O, CuO, Cr2O3, and NiO on an un-dried sample basis. The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is also given.
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