ISO 18452:2005
ISO 18452:2005 Fine ceramics (advanced ceramics, advanced technical ceramics) – Determination of thickness of ceramic films by contact-probe profilometer
CDN $131.00
Description
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
Edition
1
Published Date
2005-11-16
Status
PUBLISHED
Pages
9
Language
English
Format
Secure PDF
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Abstract
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
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