Search
×
FR

Placeholder headline

This is just a placeholder headline

API Technical Report TDB-6 Chapter 6 – Density

$

204

BUY NOW

Placeholder headline

This is just a placeholder headline

API STD 560: Fired Heaters for General Refinery Services

$

721

BUY NOW

Placeholder headline

This is just a placeholder headline

API STD 64: Diverter Equipment Systems

$

324

BUY NOW

Placeholder headline

This is just a placeholder headline

API MPMS CH 17.10.1: Refrigerated Light Hydrocarbon Fluids – Measurement of Cargoes on Board LNG Carries

$

417

BUY NOW

Placeholder headline

This is just a placeholder headline

API RP 13B-1: Testing Water-based Drilling Fluids

$

418

BUY NOW

Placeholder headline

This is just a placeholder headline

API Technical Report TDB-12 Chapter 12 – Thermal Conductivity

$

214

BUY NOW

Placeholder headline

This is just a placeholder headline

API 16FI Frac Iron Guidelines and Requirements

$

129

BUY NOW

ISO 16169:2018

ISO 16169:2018 Preparation of silicon carbide and similar materials for analysis by ISO 12677 X-ray fluorescence (XRF) – Fused cast-bead method

CDN $233.00

SKU: 25bdf08f7d96 Categories: ,

Description

This document specifies requirements for the preparation of fused beads for the chemical analysis of silicon carbide containing samples using X-ray fluorescence (XRF). The test methods described in this document are for silicon carbide and silicon carbide materials; however, the principles described can be applied to other reduced materials such as boron carbide, boron nitride, ferroalloys, sialons and silicon nitride using the modifications given in Annex A.

Fused cast beads of the samples prepared in accordance with this document are analysed in accordance with ISO 12677.

Edition

1

Published Date

2018-07-26

Status

PUBLISHED

Pages

20

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document specifies requirements for the preparation of fused beads for the chemical analysis of silicon carbide containing samples using X-ray fluorescence (XRF). The test methods described in this document are for silicon carbide and silicon carbide materials; however, the principles described can be applied to other reduced materials such as boron carbide, boron nitride, ferroalloys, sialons and silicon nitride using the modifications given in Annex A.

Fused cast beads of the samples prepared in accordance with this document are analysed in accordance with ISO 12677.

Previous Editions

Can’t find what you are looking for?

Please contact us at: