ISO 22493:2014
ISO 22493:2014 Microbeam analysis – Scanning electron microscopy – Vocabulary
CDN $263.00
Description
ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
Edition
2
Published Date
2014-04-09
Status
PUBLISHED
Pages
20
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 10110:2017 Optics and photonics – Preparation of drawings for optical elements and systems – Part 7: Surface imperfections
CDN $131.00 Add to cart -
ISO 10110:2016 Optics and photonics – Preparation of drawings for optical elements and systems – Part 11: Non-toleranced data
CDN $82.00 Add to cart -
ISO 15932:2013 Microbeam analysis – Analytical electron microscopy – Vocabulary
CDN $263.00 Add to cart -
ISO 10110:2015 Optics and photonics – Preparation of drawings for optical elements and systems – Part 6: Centring tolerances
CDN $251.00 Add to cart
