Search
×
FR

Placeholder headline

This is just a placeholder headline

API Technical Report TDB-6 Chapter 6 – Density

$

204

BUY NOW

Placeholder headline

This is just a placeholder headline

API STD 560: Fired Heaters for General Refinery Services

$

721

BUY NOW

Placeholder headline

This is just a placeholder headline

API STD 64: Diverter Equipment Systems

$

324

BUY NOW

Placeholder headline

This is just a placeholder headline

API MPMS CH 17.10.1: Refrigerated Light Hydrocarbon Fluids – Measurement of Cargoes on Board LNG Carries

$

417

BUY NOW

Placeholder headline

This is just a placeholder headline

API RP 13B-1: Testing Water-based Drilling Fluids

$

418

BUY NOW

Placeholder headline

This is just a placeholder headline

API Technical Report TDB-12 Chapter 12 – Thermal Conductivity

$

214

BUY NOW

Placeholder headline

This is just a placeholder headline

API 16FI Frac Iron Guidelines and Requirements

$

129

BUY NOW

ISO 10373:2018

ISO 10373:2018 Identification cards – Test methods – Part 3: Integrated circuit cards with contacts and related interface devices

CDN $312.00

SKU: a0d7feeb86f7 Categories: ,

Description

This document defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816-3. Each test method is cross‚Äëreferenced to one or more base standards, which can be ISO/IEC 7810 that defines the information storage technologies employed in identification card applications.

NOTE Criteria for acceptability do not form part of this document but can be found in the International Standards mentioned above.

This document defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts of the ISO/IEC 10373 series define other technology‚Äëspecific tests.

Test methods defined in this document are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in this document are based on ISO/IEC 7816-3.

Conformance of cards and IFDs determined using the test methods defined in this document does not preclude failures in the field. Reliability testing is outside the scope of this document.

This document does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. The minimum functionality is defined as follows.

– Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard.

– Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.

Edition

3

Published Date

2018-08-16

Status

PUBLISHED

Pages

50

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816-3. Each test method is cross‚Äëreferenced to one or more base standards, which can be ISO/IEC 7810 that defines the information storage technologies employed in identification card applications.

NOTE Criteria for acceptability do not form part of this document but can be found in the International Standards mentioned above.

This document defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts of the ISO/IEC 10373 series define other technology‚Äëspecific tests.

Test methods defined in this document are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in this document are based on ISO/IEC 7816-3.

Conformance of cards and IFDs determined using the test methods defined in this document does not preclude failures in the field. Reliability testing is outside the scope of this document.

This document does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. The minimum functionality is defined as follows.

- Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard.

- Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.

Previous Editions

Can’t find what you are looking for?

Please contact us at: