Sky Bear Technical Standards - Home
Search
×
FR

Placeholder headline

This is just a placeholder headline

TEMA 2026 Edition – Online Subscription Only

$

BUY NOW

Placeholder headline

This is just a placeholder headline

API RP 15SIH, 2nd Edition: Installation and Handling of Spoolable Reinforced Plastic Line Pipe

$

158

BUY NOW

Placeholder headline

This is just a placeholder headline

API RP 754, 4th Edition: Process Safety Performance Indicators for the Refining and Petrochemical Industries

$

393

BUY NOW

Placeholder headline

This is just a placeholder headline

ASME B31.1-2020: Power Piping

$

668

BUY NOW

Placeholder headline

This is just a placeholder headline

ASME B31.1-2022: Power Piping

$

668

BUY NOW

ISO 13383:2012

ISO 13383:2012 Fine ceramics (advanced ceramics, advanced technical ceramics) – Microstructural characterization – Part 2: Determination of phase volume fraction by evaluation of micrographs

CDN $130.00

SKU: eec1462a732a Categories: ,

Description

ISO 13383-2:2012 specifies a manual method of making measurements for the determination of the volume fraction of major phases in fine ceramics (advanced ceramics, advanced technical ceramics) using micrographs of polished and etched sections, overlaying a square grid of lines, and counting the number of intersections lying over each phase.

The method applies to ceramics with one or more distinct secondary phases, such as found in Al2O3/ZrO2, Si/SiC, or Al2O3/SiCw.

If the test material contains discrete pores, these are to be treated as a secondary phase for the purpose of this method, provided that there is no evidence of grain pluck-out during polishing being confused with genuine pores.

Edition

1

Published Date

2012-08-28

Status

PUBLISHED

Pages

12

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

ISO 13383-2:2012 specifies a manual method of making measurements for the determination of the volume fraction of major phases in fine ceramics (advanced ceramics, advanced technical ceramics) using micrographs of polished and etched sections, overlaying a square grid of lines, and counting the number of intersections lying over each phase.

The method applies to ceramics with one or more distinct secondary phases, such as found in Al2O3/ZrO2, Si/SiC, or Al2O3/SiCw.

If the test material contains discrete pores, these are to be treated as a secondary phase for the purpose of this method, provided that there is no evidence of grain pluck-out during polishing being confused with genuine pores.

Previous Editions

Can’t find what you are looking for?

Please contact us at: