ISO 16700:2016
ISO 16700:2016 Microbeam analysis – Scanning electron microscopy – Guidelines for calibrating image magnification
CDN $186.00
Description
ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.
Edition
2
Published Date
2016-07-18
Status
PUBLISHED
Pages
18
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 8600:2025 Endoscopes – Medical endoscopes and endotherapy devices – Part 1: General requirements
CDN $124.00 Add to cart -
ISO 10110:2015 Optics and photonics – Preparation of drawings for optical elements and systems – Part 19: General description of surfaces and components
CDN $124.00 Add to cart -
ISO 9211:2024 Optics and photonics – Optical coatings – Part 1: Vocabulary
CDN $251.00 Add to cart -
ISO 14132:2021 Optics and photonics – Vocabulary for telescopic systems – Part 3: Terms for telescopic sights
CDN $82.00 Add to cart
