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B51-14 (R2019) – Boiler, pressure vessel, and pressure piping code

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ISO 16700:2016

ISO 16700:2016 Microbeam analysis – Scanning electron microscopy – Guidelines for calibrating image magnification

CDN $192.00

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Description

ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.

Edition

2

Published Date

2016-07-18

Status

PUBLISHED

Pages

18

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.

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