ISO 17901:2015
ISO 17901:2015 Optics and photonics – Holography – Part 2: Methods for measurement of hologram recording characteristics
CDN $259.00
Description
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
Edition
1
Published Date
2015-06-29
Status
PUBLISHED
Pages
20
Language
English
Format
Secure PDF
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Abstract
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
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