ISO 17901:2015
ISO 17901:2015 Optics and photonics – Holography – Part 2: Methods for measurement of hologram recording characteristics
CDN $251.00
Description
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
Edition
1
Published Date
2015-06-29
Status
PUBLISHED
Pages
20
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 5053:2019 Industrial trucks – Vocabulary – Part 2: Fork arms and attachments
CDN $379.00 Add to cart -
ISO 10110:2019 Optics and photonics – Preparation of drawings for optical elements and systems – Part 1: General
CDN $336.00 Add to cart -
ISO 4006:1991 Measurement of fluid flow in closed conduits – Vocabulary and symbols
CDN $379.00 Add to cart -
ISO 15424:2025 Information technology – Automatic identification and data capture techniques – Data carrier identifiers (including symbology identifiers)
CDN $251.00 Add to cart
