ISO 17915:2018
ISO 17915:2018 Optics and photonics – Measurement method of semiconductor lasers for sensing
CDN $295.00
Description
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
Edition
1
Published Date
2018-05-25
Status
PUBLISHED
Pages
29
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 2574:1994 Aircraft – Electrical cables – Identification marking
CDN $124.00 Add to cart -
ISO 80004:2011 Nanotechnologies – Vocabulary – Part 7: Diagnostics and therapeutics for healthcare
CDN $124.00 Add to cart -
ISO 1176:1990 Road vehicles – Masses – Vocabulary and codes
CDN $124.00 Add to cart -
ISO 10110:2019 Optics and photonics – Preparation of drawings for optical elements and systems – Part 1: General
CDN $336.00 Add to cart
