ISO 18452:2005
ISO 18452:2005 Fine ceramics (advanced ceramics, advanced technical ceramics) – Determination of thickness of ceramic films by contact-probe profilometer
CDN $131.00
Description
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
Edition
1
Published Date
2005-11-16
Status
PUBLISHED
Pages
9
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 1176:1990 Road vehicles – Masses – Vocabulary and codes
CDN $131.00 Add to cart -
ISO 80004:2020 Nanotechnologies – Vocabulary – Part 8: Nanomanufacturing processes
CDN $86.00 Add to cart -
ISO 15424:2025 Information technology – Automatic identification and data capture techniques – Data carrier identifiers (including symbology identifiers)
CDN $263.00 Add to cart -
ISO 80000:2019 Quantities and units – Part 11: Characteristic numbers
CDN $352.00 Add to cart
