Search
×
FR

Placeholder headline

This is just a placeholder headline

API MPMS CH 10.8, 3rd Edition: Standard Test Method for Sediment in Crude Oil by Membrane Filtration

$

114

BUY NOW

Placeholder headline

This is just a placeholder headline

ISO/TR 42505:2026 Sharing economy — Shared manufacturing — Concepts and models

$

192

BUY NOW

Placeholder headline

This is just a placeholder headline

ISO 4306-1:2026 Cranes — Vocabulary — Part 1: General

$

436

BUY NOW

ISO 19606:2024

ISO 19606:2024 Fine ceramics (advanced ceramics, advanced technical ceramics) – Test method for surface roughness of fine ceramic films by atomic force microscopy

CDN $263.00

SKU: 6a6a64db9cbc Categories: ,

Description

This document specifies a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy. This method applies to surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, Rsm, in the range of about 0,04 μm to 2,5 μm.

Edition

2

Published Date

2024-11-01

Status

PUBLISHED

Pages

24

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document specifies a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy. This method applies to surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, Rsm, in the range of about 0,04 μm to 2,5 μm.

Previous Editions

Can’t find what you are looking for?

Please contact us at: