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ISO 7554-3:2026 Surgical instruments — Terms, measuring methods and test methods — Part 3: Test methods

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ISO 41002:2026 Facility management — Development of the facility management organization

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ISO 39004:2026 Road traffic safety — Good practice for service providers using digital platform

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ISO 23173:2021

ISO 23173:2021 Surface chemical analysis – Electron spectroscopies – Measurement of the thickness and composition of nanoparticle coatings

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SKU: f30448478d55 Categories: ,

Description

This document provides a description of methods by which the coating thickness and chemical composition of “core-shell” nanoparticles (including some variant and non-ideal morphologies) can be determined using electron spectroscopy techniques. It identifies the assumptions, challenges, and uncertainties associated with each method. It also describes protocols and issues for the general analysis of nanoparticle samples using electron spectroscopies, specifically in relation to their importance for measurements of coating thicknesses.

This document focuses on the use of electron spectroscopy techniques, specifically X-ray photoelectron spectroscopy, Auger electron spectroscopy, and synchrotron-based methods. These cannot provide all of the information necessary for accurate analysis and therefore some additional analytical methods are outlined in the context of their ability to aid in the interpretation of electron spectroscopy data.

Edition

1

Published Date

2021-06-25

Status

PUBLISHED

Pages

49

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document provides a description of methods by which the coating thickness and chemical composition of "core-shell" nanoparticles (including some variant and non-ideal morphologies) can be determined using electron spectroscopy techniques. It identifies the assumptions, challenges, and uncertainties associated with each method. It also describes protocols and issues for the general analysis of nanoparticle samples using electron spectroscopies, specifically in relation to their importance for measurements of coating thicknesses.

This document focuses on the use of electron spectroscopy techniques, specifically X-ray photoelectron spectroscopy, Auger electron spectroscopy, and synchrotron-based methods. These cannot provide all of the information necessary for accurate analysis and therefore some additional analytical methods are outlined in the context of their ability to aid in the interpretation of electron spectroscopy data.

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