ISO 24173:2024
ISO 24173:2024 Microbeam analysis – Guidelines for orientation measurement using electron backscatter diffraction
CDN $349.00
Description
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
Edition
2
Published Date
2024-02-09
Status
PUBLISHED
Pages
40
Language
English
Format
Secure PDF
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Abstract
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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