ISO 6342:2003
ISO 6342:2003 Micrographics – Aperture cards – Method of measuring thickness of buildup area
CDN $85.00
Description
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
Edition
2
Published Date
2003-07-15
Status
PUBLISHED
Pages
3
Language
English
Format
Secure PDF
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Abstract
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
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