ISO 17297:2025
ISO 17297:2025 Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
CDN $186.00
This publication was last reviewed and confirmed in 2025.
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
Description
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
Edition
1
Published Date
2026-06-19
Status
PUBLISHED
Pages
14
Language
English
Format
Secure PDF
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Abstract
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
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