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ISO 18227:2025

ISO 18227:2025 Environmental solid matrices — Determination of elemental composition by X-ray fluorescence spectrometry

CDN $337.00

This publication was last reviewed and confirmed in 2025.

Environmental solid matrices — Determination of elemental composition by X-ray fluorescence spectrometry

SKU: ef78bf576352 Categories: ,

Description

This document specifies the procedure for a quantitative determination of major and trace element concentrations in homogeneous solid waste, soil, soil-like material and sludge by energy dispersive X-ray fluorescence (EDXRF) spectrometry or wavelength dispersive X-ray fluorescence (WDXRF) spectrometry using a calibration with matrix-matched standards.

This document is applicable for the following elements: Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Te, I, Cs, Ba, Ta, W, Hg, Tl, Pb, Bi, Th and U. Concentration levels between a mass fraction of approximately 0,000 1 % and 100 % can be determined depending on the element and the instrument used.

An optional XRF screening method for solid and liquid material as waste, sludge and soil is added in  REF Annex_sec_A r h Annex A
08D0C9EA79F9BACE118C8200AA004BA90B02000000080000000C00000041006E006E00650078005F007300650063005F0041000000
which provides a total element characterization at a semi-quantitative level, where the calibration is based on matrix-independent calibration curves, previously set up by the manufacturer.

Edition

2

Published Date

2026-06-19

Status

PUBLISHED

Pages

38

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document specifies the procedure for a quantitative determination of major and trace element concentrations in homogeneous solid waste, soil, soil-like material and sludge by energy dispersive X-ray fluorescence (EDXRF) spectrometry or wavelength dispersive X-ray fluorescence (WDXRF) spectrometry using a calibration with matrix-matched standards.

This document is applicable for the following elements: Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Te, I, Cs, Ba, Ta, W, Hg, Tl, Pb, Bi, Th and U. Concentration levels between a mass fraction of approximately 0,000 1 % and 100 % can be determined depending on the element and the instrument used.

An optional XRF screening method for solid and liquid material as waste, sludge and soil is added in  REF Annex_sec_A r h Annex A 08D0C9EA79F9BACE118C8200AA004BA90B02000000080000000C00000041006E006E00650078005F007300650063005F0041000000 which provides a total element characterization at a semi-quantitative level, where the calibration is based on matrix-independent calibration curves, previously set up by the manufacturer.

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