ISO 23699:2026
ISO 23699:2026 Microbeam analysis — Electron backscatter diffraction — Vocabulary
CDN $129.00
This publication was last reviewed and confirmed in 2026.
Microbeam analysis — Electron backscatter diffraction — Vocabulary
Description
This document defines terms used for the electron backscatter diffraction (EBSD) technique. This document covers both general and specific concepts classified according to their hierarchy in a systematic order.
This document is applicable to standardization documents relevant to EBSD practices. In addition, some definitions in this document are applicable to transmission Kikuchi diffraction (TKD).
Edition
1
Published Date
2026-10-03
Status
PUBLISHED
Pages
11
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
This document defines terms used for the electron backscatter diffraction (EBSD) technique. This document covers both general and specific concepts classified according to their hierarchy in a systematic order.
This document is applicable to standardization documents relevant to EBSD practices. In addition, some definitions in this document are applicable to transmission Kikuchi diffraction (TKD).
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 80004:2021 Nanotechnologies – Vocabulary – Part 6: Nano-object characterization
CDN $85.00 Add to cart -
ISO 8927:1991 Earth-moving machinery – Machine availability – Vocabulary
CDN $259.00 Add to cart -
ISO 80004:2011 Nanotechnologies – Vocabulary – Part 5: Nano/bio interface
CDN $85.00 Add to cart -
ISO 5078:2025 Management of terminology resources – Terminology extraction
CDN $259.00 Add to cart
