Sky Bear Technical Standards - Home
Search
×
FR

Placeholder headline

This is just a placeholder headline

TEMA 2026 Edition – Online Subscription Only

$

BUY NOW

Placeholder headline

This is just a placeholder headline

API RP 15SIH, 2nd Edition: Installation and Handling of Spoolable Reinforced Plastic Line Pipe

$

158

BUY NOW

Placeholder headline

This is just a placeholder headline

API RP 754, 4th Edition: Process Safety Performance Indicators for the Refining and Petrochemical Industries

$

393

BUY NOW

Placeholder headline

This is just a placeholder headline

ASME B31.1-2020: Power Piping

$

668

BUY NOW

Placeholder headline

This is just a placeholder headline

ASME B31.1-2022: Power Piping

$

668

BUY NOW

ISO 25178-606:2026

ISO 25178-606:2026 Geometrical product specifications (GPS) — Surface texture: Areal — Part 606: Design and characteristics of non-contact (focus variation) instruments

CDN $251.00

This publication was last reviewed and confirmed in 2026.

Geometrical product specifications (GPS) — Surface texture: Areal — Part 606: Design and characteristics of non-contact (focus variation) instruments

SKU: 7958af267eec Category:

Description

This document specifies the design and characteristics of focus variation instruments for areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements as well.

This document applies to focus variation without pattern illumination or with fixed pattern illumination. This document does not cover methods using varying pattern illumination during the measurement.

Edition

2

Published Date

2026-06-19

Status

PUBLISHED

Pages

19

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document specifies the design and characteristics of focus variation instruments for areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements as well.

This document applies to focus variation without pattern illumination or with fixed pattern illumination. This document does not cover methods using varying pattern illumination during the measurement.

Previous Editions

Can’t find what you are looking for?

Please contact us at: