ICS:37.020
Showing 136–139 of 139 results
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ISO 22493:2014 Microbeam analysis – Scanning electron microscopy – Vocabulary
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ISO 10110:2015 Optics and photonics – Preparation of drawings for optical elements and systems – Part 6: Centring tolerances
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ISO 15795:2007 Optics and optical instruments – Quality evaluation of optical systems – Assessing the image quality degradation due to chromatic aberrations – Technical Corrigendum 1
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ISO 8037:2002 Optics and optical instruments – Microscopes – Slides – Part 2: Quality of material, standards of finish and mode of packaging – Technical Corrigendum 1
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