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B51-14 (R2019) – Boiler, pressure vessel, and pressure piping code

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ISO 18118:2024

ISO 18118:2024 Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

CDN $259.00

SKU: a14b0495aa21 Categories: ,

Description

This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.

Edition

3

Published Date

2024-02-28

Status

PUBLISHED

Pages

22

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.

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