ICS:71.040.40
Showing 1–9 of 126 results
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ISO 16242:2011 Surface chemical analysis – Recording and reporting data in Auger electron spectroscopy (AES)
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ISO 22048:2004 Surface chemical analysis – Information format for static secondary-ion mass spectrometry
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ISO 21270:2004 Surface chemical analysis – X-ray photoelectron and Auger electron spectrometers – Linearity of intensity scale
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ISO 24236:2005 Surface chemical analysis – Auger electron spectroscopy – Repeatability and constancy of intensity scale
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ISO 24237:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Repeatability and constancy of intensity scale
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ISO 18392:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Procedures for determining backgrounds
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ISO 758:1976 Liquid chemical products for industrial use – Determination of density at 20 degrees C
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ISO 11775:2015 Surface chemical analysis – Scanning-probe microscopy – Determination of cantilever normal spring constants
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ISO 12406:2010 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth profiling of arsenic in silicon
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