ICS:71.040.40
Showing 1–9 of 134 results
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ISO 25138:2025 Surface chemical analysis – Analysis of metal oxide films by glow discharge optical emission spectrometry
CDN $352.00 Add to cart -
ISO 11775:2015 Surface chemical analysis – Scanning-probe microscopy – Determination of cantilever normal spring constants
CDN $263.00 Add to cart -
ISO 20341:2003 Surface chemical analysis – Secondary-ion mass spectrometry – Method for estimating depth resolution parameters with multiple delta-layer reference materials
CDN $86.00 Add to cart -
ISO 15969:2021 Surface chemical analysis – Depth profiling – Measurement of sputtered depth
CDN $195.00 Add to cart -
ISO 14606:2022 Surface chemical analysis – Sputter depth profiling – Optimization using layered systems as reference materials
CDN $195.00 Add to cart -
ISO 14976:1998 Surface chemical analysis – Data transfer format
CDN $352.00 Add to cart -
ISO 24237:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Repeatability and constancy of intensity scale
CDN $131.00 Add to cart -
ISO 19830:2015 Surface chemical analysis – Electron spectroscopies – Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
CDN $263.00 Add to cart -
ISO 16962:2017 Surface chemical analysis – Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
CDN $352.00 Add to cart
