ICS:71.040.40
Showing 1–9 of 134 results
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ISO 25138:2025 Surface chemical analysis – Analysis of metal oxide films by glow discharge optical emission spectrometry
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ISO 6145:2018 Gas analysis – Preparation of calibration gas mixtures using dynamic methods – Part 7: Thermal mass-flow controllers
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ISO 24237:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Repeatability and constancy of intensity scale
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ISO 15969:2021 Surface chemical analysis – Depth profiling – Measurement of sputtered depth
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ISO 14976:1998 Surface chemical analysis – Data transfer format
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ISO 14606:2022 Surface chemical analysis – Sputter depth profiling – Optimization using layered systems as reference materials
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ISO 24417:2022 Surface chemical analysis – Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
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ISO 23170:2022 Surface chemical analysis – Depth profiling – Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
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ISO 10810:2019 Surface chemical analysis – X-ray photoelectron spectroscopy – Guidelines for analysis
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