Sky Bear Technical Standards - Home
Search
×
FR

Placeholder headline

This is just a placeholder headline

B51-14 (R2019) – Boiler, pressure vessel, and pressure piping code

$

362

BUY NOW

ISO 18114:2021

ISO 18114:2021 Surface chemical analysis – Secondary-ion mass spectrometry – Determination of relative sensitivity factors from ion-implanted reference materials

CDN $85.00

SKU: 53ad86464c1e Categories: ,

Description

This document specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted reference materials.

The method is applicable to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent.

Edition

2

Published Date

2021-05-11

Status

PUBLISHED

Pages

4

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted reference materials.

The method is applicable to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent.

Previous Editions

Can’t find what you are looking for?

Please contact us at: