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ISO 11505:2012

ISO 11505:2012 Surface chemical analysis – General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

CDN $273.00

Description

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

Edition

1

Published Date

2012-12-12

Status

PUBLISHED

Pages

33

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

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