ISO 16243:2011
ISO 16243:2011 Surface chemical analysis – Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
CDN $115.00
Description
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‚Äëray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
Edition
1
Published Date
2011-11-25
Status
PUBLISHED
Pages
9
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‚Äëray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 80004:2020 Nanotechnologies – Vocabulary – Part 8: Nanomanufacturing processes
CDN $76.00 Add to cart -
ISO 80000:2019 Quantities and units – Part 11: Characteristic numbers
CDN $312.00 Add to cart -
ISO 5053:2019 Industrial trucks – Vocabulary – Part 2: Fork arms and attachments
CDN $351.00 Add to cart -
ISO 4006:1991 Measurement of fluid flow in closed conduits – Vocabulary and symbols
CDN $351.00 Add to cart
