ISO 16243:2011
ISO 16243:2011 Surface chemical analysis – Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
CDN $129.00
Description
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‚Äëray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
Edition
1
Published Date
2011-11-25
Status
PUBLISHED
Pages
9
Language
English
Format
Secure PDF
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Abstract
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‚Äëray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
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