ISO 17470:2014
ISO 17470:2014 Microbeam analysis – Electron probe microanalysis – Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
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Description
ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
Edition
2
Published Date
2014-01-06
Status
PUBLISHED
Pages
10
Language
English
Format
Secure PDF
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Abstract
ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
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