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B51-14 (R2019) – Boiler, pressure vessel, and pressure piping code

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ISO 17470:2014

ISO 17470:2014 Microbeam analysis – Electron probe microanalysis – Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

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Description

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Edition

2

Published Date

2014-01-06

Status

PUBLISHED

Pages

10

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

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