Search
×
FR

Placeholder headline

This is just a placeholder headline

API MPMS CH 10.8, 3rd Edition: Standard Test Method for Sediment in Crude Oil by Membrane Filtration

$

114

BUY NOW

Placeholder headline

This is just a placeholder headline

ISO/TR 42505:2026 Sharing economy — Shared manufacturing — Concepts and models

$

192

BUY NOW

Placeholder headline

This is just a placeholder headline

ISO 4306-1:2026 Cranes — Vocabulary — Part 1: General

$

436

BUY NOW

ISO 20720:2018

ISO 20720:2018 Microbeam analysis – Methods of specimen preparation for analysis of general powders using WDS and EDS

CDN $131.00

SKU: ae0c40bb6616 Category:

Description

This document specifies specimen preparation methods for the analysis of particles in powders using energy-dispersive spectrometers (EDS) or wavelength-dispersive spectrometers (WDS) installed on an EPMA or SEM. The preparation methods for powder particle analysis are classified by the analytical purpose and the particle size.

This document applies to inorganic particles larger than 100 nm and smaller than 100 µm in diameter.

It applies only to analysis of “general” powders, which means that it excludes procedures for special applications such as forensic or trace analysis.

Edition

1

Published Date

2018-10-18

Status

PUBLISHED

Pages

9

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document specifies specimen preparation methods for the analysis of particles in powders using energy-dispersive spectrometers (EDS) or wavelength-dispersive spectrometers (WDS) installed on an EPMA or SEM. The preparation methods for powder particle analysis are classified by the analytical purpose and the particle size.

This document applies to inorganic particles larger than 100 nm and smaller than 100 µm in diameter.

It applies only to analysis of "general" powders, which means that it excludes procedures for special applications such as forensic or trace analysis.

Previous Editions

Can’t find what you are looking for?

Please contact us at: