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B51-14 (R2019) – Boiler, pressure vessel, and pressure piping code

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ISO 21222:2020

ISO 21222:2020 Surface chemical analysis – Scanning probe microscopy – Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

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Description

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

Edition

1

Published Date

2020-01-29

Status

PUBLISHED

Pages

17

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

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