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ISO 21270:2004
ISO 21270:2004 Surface chemical analysis – X-ray photoelectron and Auger electron spectrometers – Linearity of intensity scale
CDN $173.00
Description
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
Edition
1
Published Date
2004-06-15
Status
PUBLISHED
Pages
13
Language
English
Format
Secure PDF
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Abstract
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
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