ISO 21270:2004
ISO 21270:2004 Surface chemical analysis – X-ray photoelectron and Auger electron spectrometers – Linearity of intensity scale
CDN $186.00
Description
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
Edition
1
Published Date
2004-06-15
Status
PUBLISHED
Pages
13
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 2382:2015 Information technology – Vocabulary
CDN $0.00 Add to cart -
ISO 80004:2011 Nanotechnologies – Vocabulary – Part 7: Diagnostics and therapeutics for healthcare
CDN $124.00 Add to cart -
ISO 8927:1991 Earth-moving machinery – Machine availability – Vocabulary
CDN $251.00 Add to cart -
ISO 16520:2025 Tourism and related services – Restaurants and catering – Vocabulary
CDN $186.00 Add to cart
