ISO 23729:2022
ISO 23729:2022 Surface chemical analysis – Atomic force microscopy – Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
CDN $195.00
Description
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
Edition
1
Published Date
2022-07-13
Status
PUBLISHED
Pages
15
Language
English
Format
Secure PDF
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Abstract
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
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