Your cart is currently empty!
“ISO 80004:2021 Nanotechnologies – Vocabulary – Part 6: Nano-object characterization” has been added to your cart. View cart
ISO 6442:2005
ISO 6442:2005 Door leaves – General and local flatness – Measurement method
CDN $76.00
Description
ISO 6442:2005 can be applied to all rectangular door leaves.
ISO 6442:2005 specifies the method to be used to measure the deviations in general and local flatness of door leaves.
In ISO 6442:2005, the concept of local flatness deviation is limited to defects considered to be prejudicial to the appearance of the door leaf.
Edition
2
Published Date
2005-10-20
Status
PUBLISHED
Pages
2
Language
English
Format
Secure PDF
Secure – PDF details
- Save your file locally or view it via a web viewer
- Viewing permissions are restricted exclusively to the purchaser
- Device limits - 3
- Printing – Enabled only to print (1) copy
See more about our Environmental Commitment
Abstract
ISO 6442:2005 can be applied to all rectangular door leaves.
ISO 6442:2005 specifies the method to be used to measure the deviations in general and local flatness of door leaves.
In ISO 6442:2005, the concept of local flatness deviation is limited to defects considered to be prejudicial to the appearance of the door leaf.
Previous Editions
Can’t find what you are looking for?
Please contact us at:
Related Documents
-
ISO 80000:2025 Quantities and units – Part 13: Information science and technology
CDN $203.00 Add to cart -
ISO 80000:2019 Quantities and units – Part 11: Characteristic numbers
CDN $312.00 Add to cart -
ISO 2382:2015 Information technology – Vocabulary
CDN $0.00 Add to cart -
ISO 5078:2025 Management of terminology resources – Terminology extraction
CDN $233.00 Add to cart
