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ISO 13084:2025

ISO 13084:2025 Surface chemical analysis — Mass spectrometries — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

CDN $186.00

This publication was last reviewed and confirmed in 2025.

Surface chemical analysis — Mass spectrometries — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Description

This document specifies a method to optimize the mass calibration accuracy in time-of-flight secondary ion mass spectrometry (SIMS) instruments used for general analytical purposes. This document is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. This document gives guidance for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.

Edition

3

Published Date

2026-06-18

Status

PUBLISHED

Pages

13

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This document specifies a method to optimize the mass calibration accuracy in time-of-flight secondary ion mass spectrometry (SIMS) instruments used for general analytical purposes. This document is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. This document gives guidance for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.

Previous Editions

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