ICS:37.020
Showing 37–45 of 150 results
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ISO 14132:2021 Optics and photonics – Vocabulary for telescopic systems – Part 3: Terms for telescopic sights
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ISO 21383:2021 Microbeam analysis – Scanning electron microscopy – Qualification of the scanning electron microscope for quantitative measurements
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ISO 11882:1997 Optics and optical instruments – Microscopes – Interfacing connection for 35 mm SLR photo cameras (T-thread adaptation)
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ISO 9358:1994 Optics and optical instruments – Veiling glare of image forming systems – Definitions and methods of measurement
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ISO 11884:2006 Optics and photonics – Minimum requirements for stereomicroscopes – Part 1: Stereomicroscopes for general use
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ISO 10110:2004 Optics and photonics – Preparation of drawings for optical elements and systems – Part 17: Laser irradiation damage threshold
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ISO 19012:2013 Microscopes – Designation of microscope objectives – Part 1: Flatness of field/Plan
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ISO 20263:2024 Microbeam analysis – Analytical electron microscopy – Method for the determination of interface position in the cross-sectional image of the layered materials
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ISO 14490:2019 Optics and photonics – Test methods for telescopic systems – Part 9: Test methods for field curvature
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