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API TR 5C3: Calculating Performance Properties of Pipe Used as Casing or Tubing

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API RP 576: Inspection of Pressure-relieving Devices: Addendum 1

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ISO 11938:2012

ISO 11938:2012 Microbeam analysis – Electron probe microanalysis – Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

CDN $115.00

SKU: 877e15323d6a Category:

Description

This International Standard provides procedures for electron microprobe elemental-mapping analysis using

wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally

across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is

assessed. It describes five types of data processing: the raw X‚Äëray intensity data method, the k‚Äëvalue method,

the calibration method, the correlation method and the matrix correction method.

Edition

1

Published Date

2012-03-06

Status

PUBLISHED

Pages

10

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

This International Standard provides procedures for electron microprobe elemental-mapping analysis using

wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally

across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is

assessed. It describes five types of data processing: the raw X‚Äëray intensity data method, the k‚Äëvalue method,

the calibration method, the correlation method and the matrix correction method.

Previous Editions

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