ISO 11938:2012
ISO 11938:2012 Microbeam analysis – Electron probe microanalysis – Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
CDN $130.00
Description
This International Standard provides procedures for electron microprobe elemental-mapping analysis using
wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally
across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is
assessed. It describes five types of data processing: the raw X‚Äëray intensity data method, the k‚Äëvalue method,
the calibration method, the correlation method and the matrix correction method.
Edition
1
Published Date
2012-03-06
Status
PUBLISHED
Pages
10
Language
English
Format
Secure PDF
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Abstract
This International Standard provides procedures for electron microprobe elemental-mapping analysis using
wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally
across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is
assessed. It describes five types of data processing: the raw X‚Äëray intensity data method, the k‚Äëvalue method,
the calibration method, the correlation method and the matrix correction method.
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