SUSTAINABLE_DEVELOPMENT_GOAL:9
Showing 7282–7290 of 10000 results
-
ISO 17109:2022 Surface chemical analysis – Depth profiling – Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
CDN $251.00 Add to cart -
ISO 5771:2024 Rubber hoses and hose assemblies for transferring anhydrous ammonia – Specification
CDN $186.00 Add to cart -
ISO 23812:2009 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth calibration for silicon using multiple delta-layer reference materials
CDN $251.00 Add to cart -
ISO 17560:2014 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth profiling of boron in silicon
CDN $124.00 Add to cart -
ISO 16664:2017 Gas analysis – Handling of calibration gases and gas mixtures – Guidelines
CDN $186.00 Add to cart -
ISO 12963:2017 Gas analysis – Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
CDN $251.00 Add to cart -
ISO 10632:2000 Oilseed residues – Simultaneous determination of oil and water contents – Method using pulsed nuclear magnetic resonance spectroscopy
CDN $124.00 Add to cart -
ISO 15661:2020 Copper and nickel sulfide ores and concentrates – Determination of total chlorine content – Alkaline fusion and potentiometric titration method
CDN $186.00 Add to cart -
ISO 13543:2016 Copper, lead, zinc and nickel sulfide concentrates – Determination of mass of contained metal in a lot
CDN $124.00 Add to cart
