ICS:71.040.40
Showing 109–117 of 134 results
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ISO 23812:2009 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth calibration for silicon using multiple delta-layer reference materials
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ISO 21079:2008 Chemical analysis of refractories containing alumina, zirconia, and silica – Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) – Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP -AES)
CDN $195.00 Add to cart -
ISO 15796:2005 Gas analysis – Investigation and treatment of analytical bias
CDN $310.00 Add to cart -
ISO 18554:2016 Surface chemical analysis – Electron spectroscopies – Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
CDN $195.00 Add to cart -
ISO 11505:2025 Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
CDN $296.00 Add to cart -
ISO 25095-2:2026 Propylene oxide for industrial use — Part 2: Determination of aldehydes by liquid chromatography
CDN $125.00 Add to cart -
ISO 18337:2015 Surface chemical analysis – Surface characterization – Measurement of the lateral resolution of a confocal fluorescence microscope
CDN $131.00 Add to cart -
ISO 3165:1976 Sampling of chemical products for industrial use – Safety in sampling
CDN $86.00 Add to cart -
ISO 16531:2020 Surface chemical analysis – Depth profiling – Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
CDN $263.00 Add to cart
