ICS:71.040.40
Showing 10–18 of 137 results
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ISO 24237:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Repeatability and constancy of intensity scale
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ISO 19668:2017 Surface chemical analysis – X-ray photoelectron spectroscopy – Estimating and reporting detection limits for elements in homogeneous materials
CDN $259.00 Add to cart -
ISO 20411:2018 Surface chemical analysis – Secondary ion mass spectrometry – Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
CDN $192.00 Add to cart -
ISO 22048:2004 Surface chemical analysis – Information format for static secondary-ion mass spectrometry
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ISO 16242:2011 Surface chemical analysis – Recording and reporting data in Auger electron spectroscopy (AES)
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ISO 18114:2021 Surface chemical analysis – Secondary-ion mass spectrometry – Determination of relative sensitivity factors from ion-implanted reference materials
CDN $85.00 Add to cart -
ISO 16962:2017 Surface chemical analysis – Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
CDN $347.00 Add to cart -
ISO 11775:2015 Surface chemical analysis – Scanning-probe microscopy – Determination of cantilever normal spring constants
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ISO 20579:2021 Surface chemical analysis – Sample handling, preparation and mounting – Part 3: Biomaterials
CDN $129.00 Add to cart
