ICS:71.040.40
Showing 10–18 of 134 results
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ISO 19668:2017 Surface chemical analysis – X-ray photoelectron spectroscopy – Estimating and reporting detection limits for elements in homogeneous materials
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ISO 6145:2018 Gas analysis – Preparation of calibration gas mixtures using dynamic methods – Part 7: Thermal mass-flow controllers
CDN $195.00 Add to cart -
ISO 10810:2019 Surface chemical analysis – X-ray photoelectron spectroscopy – Guidelines for analysis
CDN $310.00 Add to cart -
ISO 23170:2022 Surface chemical analysis – Depth profiling – Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
CDN $310.00 Add to cart -
ISO 20411:2018 Surface chemical analysis – Secondary ion mass spectrometry – Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
CDN $195.00 Add to cart -
ISO 24417:2022 Surface chemical analysis – Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
CDN $310.00 Add to cart -
ISO 758:1976 Liquid chemical products for industrial use – Determination of density at 20 degrees C
CDN $86.00 Add to cart -
ISO 13083:2015 Surface chemical analysis – Scanning probe microscopy – Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
CDN $195.00 Add to cart -
ISO 12406:2010 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth profiling of arsenic in silicon
CDN $195.00 Add to cart
