ICS:71.040.40
Showing 19–27 of 134 results
-
ISO 18392:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Procedures for determining backgrounds
CDN $131.00 Add to cart -
ISO 24236:2005 Surface chemical analysis – Auger electron spectroscopy – Repeatability and constancy of intensity scale
CDN $195.00 Add to cart -
ISO 16242:2011 Surface chemical analysis – Recording and reporting data in Auger electron spectroscopy (AES)
CDN $131.00 Add to cart -
ISO 6144:2003 Gas analysis – Preparation of calibration gas mixtures – Static volumetric method
CDN $310.00 Add to cart -
ISO 22048:2004 Surface chemical analysis – Information format for static secondary-ion mass spectrometry
CDN $131.00 Add to cart -
ISO 21270:2004 Surface chemical analysis – X-ray photoelectron and Auger electron spectrometers – Linearity of intensity scale
CDN $195.00 Add to cart -
ISO 20579:2021 Surface chemical analysis – Sample handling, preparation and mounting – Part 3: Biomaterials
CDN $131.00 Add to cart -
ISO 18114:2021 Surface chemical analysis – Secondary-ion mass spectrometry – Determination of relative sensitivity factors from ion-implanted reference materials
CDN $86.00 Add to cart -
ISO 20289:2025 Surface chemical analysis — Total reflection X-ray fluorescence analysis of water
CDN $251.00 Add to cart
