ICS:71.040.40
Showing 19–27 of 137 results
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ISO 13083:2015 Surface chemical analysis – Scanning probe microscopy – Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
CDN $192.00 Add to cart -
ISO 20341:2003 Surface chemical analysis – Secondary-ion mass spectrometry – Method for estimating depth resolution parameters with multiple delta-layer reference materials
CDN $85.00 Add to cart -
ISO 12406:2010 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth profiling of arsenic in silicon
CDN $192.00 Add to cart -
ISO 6144:2003 Gas analysis – Preparation of calibration gas mixtures – Static volumetric method
CDN $305.00 Add to cart -
ISO 25138:2025 Surface chemical analysis – Analysis of metal oxide films by glow discharge optical emission spectrometry
CDN $349.00 Add to cart -
ISO 21270:2004 Surface chemical analysis – X-ray photoelectron and Auger electron spectrometers – Linearity of intensity scale
CDN $193.00 Add to cart -
ISO 19830:2015 Surface chemical analysis – Electron spectroscopies – Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
CDN $261.00 Add to cart -
ISO 758:1976 Liquid chemical products for industrial use – Determination of density at 20 degrees C
CDN $85.00 Add to cart -
ISO/TR 4550:2026 Surface chemical analysis — Surface chemical analysis of bacteria and biofilms
CDN $307.00 Add to cart
