ICS:71.040.40
Showing 118–126 of 134 results
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ISO 18507:2015 Surface chemical analysis – Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
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ISO 14706:2014 Surface chemical analysis – Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
CDN $263.00 Add to cart -
ISO 6145:2017 Gas analysis – Preparation of calibration gas mixtures using dynamic methods – Part 6: Critical flow orifices
CDN $310.00 Add to cart -
ISO 14187:2020 Surface chemical analysis – Characterization of nanostructured materials
CDN $352.00 Add to cart -
ISO 16129:2018 Surface chemical analysis – X-ray photoelectron spectroscopy – Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
CDN $195.00 Add to cart -
ISO 19230:2020 Gas analysis – Sampling guidelines
CDN $352.00 Add to cart -
ISO 14701:2018 Surface chemical analysis – X-ray photoelectron spectroscopy – Measurement of silicon oxide thickness
CDN $195.00 Add to cart -
ISO 23124:2024 Surface chemical analysis – Measurement of lateral and axial resolutions of a Raman microscope
CDN $131.00 Add to cart -
ISO 18394:2016 Surface chemical analysis – Auger electron spectroscopy – Derivation of chemical information
CDN $263.00 Add to cart
