ICS:71.040.40
Showing 118–126 of 137 results
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ISO 21079:2008 Chemical analysis of refractories containing alumina, zirconia, and silica – Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) – Part 2: Wet chemical analysis
CDN $192.00 Add to cart -
ISO 14701:2018 Surface chemical analysis – X-ray photoelectron spectroscopy – Measurement of silicon oxide thickness
CDN $192.00 Add to cart -
ISO 23124:2024 Surface chemical analysis – Measurement of lateral and axial resolutions of a Raman microscope
CDN $129.00 Add to cart -
ISO 18394:2016 Surface chemical analysis – Auger electron spectroscopy – Derivation of chemical information
CDN $259.00 Add to cart -
ISO 14706:2014 Surface chemical analysis – Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
CDN $259.00 Add to cart -
ISO 6141:2020 Gas analysis – Contents of certificates for calibration gas mixtures – Amendment 1: Cross reference list to ISO Guide 31:2015 and ISO/IEC 17025:2017
CDN $35.00 Add to cart -
ISO 19229:2019/Amd 1:2026 Gas analysis — Purity analysis and the treatment of purity data — Amendment 1: Correction of Formula A.4
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ISO 19230:2020 Gas analysis – Sampling guidelines
CDN $347.00 Add to cart -
ISO 759:1981 Volatile organic liquids for industrial use – Determination of dry residue after evaporation on water bath – General method
CDN $85.00 Add to cart
