ICS:71.040.40
Showing 37–45 of 134 results
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ISO 20579:2024 Surface chemical analysis – Sample handling, preparation and mounting – Part 1: Documenting and reporting the handling of specimens prior to analysis
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ISO 12963:2020 Gas analysis – Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration – Amendment 1: Correction to Formula 5
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ISO 19318:2021 Surface chemical analysis – X-ray photoelectron spectroscopy – Reporting of methods used for charge control and charge correction
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ISO 19229:2019 Gas analysis – Purity analysis and the treatment of purity data
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ISO 21222:2020 Surface chemical analysis – Scanning probe microscopy – Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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ISO 20903:2019 Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Methods used to determine peak intensities and information required when reporting results
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ISO 17862:2022 Surface chemical analysis – Secondary ion mass spectrometry – Linearity of intensity scale in single ion counting time-of-flight mass analysers
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ISO 15470:2017 Surface chemical analysis – X-ray photoelectron spectroscopy – Description of selected instrumental performance parameters
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ISO 14167:2018 Gas analysis – General quality aspects and metrological traceability of calibration gas mixtures
CDN $263.00 Add to cart
