ICS:71.040.40
Showing 37–45 of 137 results
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ISO 20903:2019 Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Methods used to determine peak intensities and information required when reporting results
CDN $192.00 Add to cart -
ISO 16268:2009 Surface chemical analysis – Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
CDN $259.00 Add to cart -
ISO 19693:2018 Surface chemical analysis – Characterization of functional glass substrates for biosensing applications
CDN $305.00 Add to cart -
ISO 6227:1982 Chemical products for industrial use – General method for determination of chloride ions – Potentiometric method
CDN $129.00 Add to cart -
ISO 14237:2010 Surface chemical analysis – Secondary-ion mass spectrometry – Determination of boron atomic concentration in silicon using uniformly doped materials
CDN $259.00 Add to cart -
ISO 14167:2018 Gas analysis – General quality aspects and metrological traceability of calibration gas mixtures
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ISO 20579:2024 Surface chemical analysis – Sample handling, preparation and mounting – Part 1: Documenting and reporting the handling of specimens prior to analysis
CDN $192.00 Add to cart -
ISO 16243:2011 Surface chemical analysis – Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
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ISO 15470:2017 Surface chemical analysis – X-ray photoelectron spectroscopy – Description of selected instrumental performance parameters
CDN $85.00 Add to cart
