ICS:71.040.40

Showing 1–9 of 126 results

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  ISO 14976:1998 Surface chemical analysis – Data transfer format

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  ISO 22048:2004 Surface chemical analysis – Information format for static secondary-ion mass spectrometry

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  ISO 21270:2004 Surface chemical analysis – X-ray photoelectron and Auger electron spectrometers – Linearity of intensity scale

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  CDN $173.00 Add to cart
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  ISO 24236:2005 Surface chemical analysis – Auger electron spectroscopy – Repeatability and constancy of intensity scale

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  CDN $173.00 Add to cart
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  ISO 24237:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Repeatability and constancy of intensity scale

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  CDN $115.00 Add to cart
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  ISO 18392:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Procedures for determining backgrounds

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  ISO 758:1976 Liquid chemical products for industrial use – Determination of density at 20 degrees C

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  CDN $76.00 Add to cart
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  ISO 11775:2015 Surface chemical analysis – Scanning-probe microscopy – Determination of cantilever normal spring constants

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  ISO 12406:2010 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth profiling of arsenic in silicon

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  CDN $173.00 Add to cart