ICS:71.040.40
Showing 100–108 of 134 results
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ISO 13424:2013 Surface chemical analysis – X-ray photoelectron spectroscopy – Reporting of results of thin-film analysis
CDN $352.00 Add to cart -
ISO 11039:2012 Surface chemical analysis – Scanning-probe microscopy – Measurement of drift rate
CDN $263.00 Add to cart -
ISO 17331:2010 Surface chemical analysis – Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy – Amendment 1
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ISO 18118:2024 Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
CDN $263.00 Add to cart -
ISO 11952:2019 Surface chemical analysis – Scanning-probe microscopy – Determination of geometric quantities using SPM: Calibration of measuring systems
CDN $397.00 Add to cart -
ISO 17560:2014 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth profiling of boron in silicon
CDN $131.00 Add to cart -
ISO 16664:2017 Gas analysis – Handling of calibration gases and gas mixtures – Guidelines
CDN $195.00 Add to cart -
ISO 23729:2022 Surface chemical analysis – Atomic force microscopy – Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
CDN $195.00 Add to cart -
ISO 12963:2017 Gas analysis – Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
CDN $263.00 Add to cart
