ICS:71.040.40
Showing 100–108 of 137 results
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ISO 17331:2010 Surface chemical analysis – Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy – Amendment 1
CDN $35.00 Add to cart -
ISO 12963:2017 Gas analysis – Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
CDN $259.00 Add to cart -
ISO 11952:2019 Surface chemical analysis – Scanning-probe microscopy – Determination of geometric quantities using SPM: Calibration of measuring systems
CDN $391.00 Add to cart -
ISO 760:1978 Determination of water – Karl Fischer method (General method)
CDN $129.00 Add to cart -
ISO 18554:2016 Surface chemical analysis – Electron spectroscopies – Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
CDN $192.00 Add to cart -
ISO 15796:2005 Gas analysis – Investigation and treatment of analytical bias
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ISO 21079:2008 Chemical analysis of refractories containing alumina, zirconia, and silica – Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) – Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP -AES)
CDN $192.00 Add to cart -
ISO 16664:2017 Gas analysis – Handling of calibration gases and gas mixtures – Guidelines
CDN $192.00 Add to cart -
ISO 11039:2012 Surface chemical analysis – Scanning-probe microscopy – Measurement of drift rate
CDN $259.00 Add to cart
