ICS:71.040.40

Showing 91–99 of 137 results

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  ISO 14912:2003 Gas analysis – Conversion of gas mixture composition data

  CDN $379.00 Add to cart
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  ISO 5861:2024 Surface chemical analysis РX-ray photoelectron spectroscopy РMethod of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

  CDN $305.00 Add to cart
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  ISO 7431:2024 Thiourea for industrial use – Part 2: Specifications

  CDN $85.00 Add to cart
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  ISO 7431:2024 Thiourea for industrial use – Part 1: Test methods

  CDN $129.00 Add to cart
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  ISO 17560:2014 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth profiling of boron in silicon

  CDN $129.00 Add to cart
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  ISO 15472:2010 Surface chemical analysis – X-ray photoelectron spectrometers – Calibration of energy scales

  CDN $305.00 Add to cart
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  ISO 18118:2024 Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

  CDN $259.00 Add to cart
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  ISO 23729:2022 Surface chemical analysis – Atomic force microscopy – Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

  CDN $192.00 Add to cart
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  ISO 13424:2013 Surface chemical analysis – X-ray photoelectron spectroscopy – Reporting of results of thin-film analysis

  CDN $347.00 Add to cart