ICS:71.040.40
Showing 73–81 of 134 results
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ISO 29081:2010 Surface chemical analysis – Auger electron spectroscopy – Reporting of methods used for charge control and charge correction
CDN $263.00 Add to cart -
ISO 27911:2011 Surface chemical analysis – Scanning-probe microscopy – Definition and calibration of the lateral resolution of a near-field optical microscope
CDN $195.00 Add to cart -
ISO 23830:2008 Surface chemical analysis – Secondary-ion mass spectrometry – Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
CDN $131.00 Add to cart -
ISO 6145:2005 Gas analysis – Preparation of calibration gas mixtures using dynamic volumetric methods – Part 8: Diffusion method
CDN $263.00 Add to cart -
ISO 17331:2004 Surface chemical analysis – Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
CDN $195.00 Add to cart -
ISO 17974:2002 Surface chemical analysis – High-resolution Auger electron spectrometers – Calibration of energy scales for elemental and chemical-state analysis
CDN $310.00 Add to cart -
ISO 6228:1980 Chemical products for industrial use – General method for determination of traces of sulphur compounds, as sulphate, by reduction and titrimetry
CDN $131.00 Add to cart -
ISO 6142:2020 Gas analysis – Preparation of calibration gas mixtures – Part 1: Gravimetric method for Class I mixtures – Amendment 1: Corrections to formulae in Annex E and Annex G
CDN $35.00 Add to cart -
ISO 6145:2002 Gas analysis – Preparation of calibration gas mixtures using dynamic volumetric methods – Part 10: Permeation method
CDN $195.00 Add to cart
