ICS:71.040.40
Showing 100–108 of 126 results
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ISO 14912:2003 Gas analysis – Conversion of gas mixture composition data
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ISO 11952:2019 Surface chemical analysis – Scanning-probe microscopy – Determination of geometric quantities using SPM: Calibration of measuring systems
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ISO 18554:2016 Surface chemical analysis – Electron spectroscopies – Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
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ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry – Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
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ISO 7431:2024 Thiourea for industrial use – Part 1: Test methods
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ISO 7431:2024 Thiourea for industrial use – Part 2: Specifications
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ISO 18115:2021 Surface chemical analysis – Vocabulary – Part 2: Terms used in scanning-probe microscopy
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ISO 6141:2020 Gas analysis – Contents of certificates for calibration gas mixtures – Amendment 1: Cross reference list to ISO Guide 31:2015 and ISO/IEC 17025:2017
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ISO 16531:2020 Surface chemical analysis – Depth profiling – Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
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