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ICS:71.040.40
Showing 100–108 of 126 results
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ISO 12963:2017 Gas analysis – Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
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ISO 17331:2010 Surface chemical analysis – Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy – Amendment 1
CDN $32.00 Add to cart -
ISO 6143:2001 Gas analysis – Comparison methods for determining and checking the composition of calibration gas mixtures
CDN $273.00 Add to cart -
ISO 14912:2003 Gas analysis – Conversion of gas mixture composition data
CDN $351.00 Add to cart -
ISO 7431:2024 Thiourea for industrial use – Part 1: Test methods
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ISO 7431:2024 Thiourea for industrial use – Part 2: Specifications
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ISO 18115:2021 Surface chemical analysis – Vocabulary – Part 2: Terms used in scanning-probe microscopy
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ISO 21079:2008 Chemical analysis of refractories containing alumina, zirconia and silica – Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) – Part 1: Apparatus, reagents and dissolution
CDN $173.00 Add to cart -
ISO 6145:2005 Gas analysis – Preparation of calibration gas mixtures using dynamic volumetric methods – Part 11: Electrochemical generation
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