Your cart is currently empty!
ICS:71.040.40
Showing 109–117 of 126 results
-
ISO 21079:2008 Chemical analysis of refractories containing alumina, zirconia, and silica – Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) – Part 2: Wet chemical analysis
CDN $173.00 Add to cart -
ISO 759:1981 Volatile organic liquids for industrial use – Determination of dry residue after evaporation on water bath – General method
CDN $76.00 Add to cart -
ISO 918:1983 Volatile organic liquids for industrial use – Determination of distillation characteristics
CDN $115.00 Add to cart -
ISO 14706:2014 Surface chemical analysis – Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
CDN $233.00 Add to cart -
ISO 18337:2015 Surface chemical analysis – Surface characterization – Measurement of the lateral resolution of a confocal fluorescence microscope
CDN $115.00 Add to cart -
ISO 18507:2015 Surface chemical analysis – Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
CDN $273.00 Add to cart -
ISO 19230:2020 Gas analysis – Sampling guidelines
CDN $312.00 Add to cart -
ISO 18394:2016 Surface chemical analysis – Auger electron spectroscopy – Derivation of chemical information
CDN $233.00 Add to cart -
ISO 23124:2024 Surface chemical analysis – Measurement of lateral and axial resolutions of a Raman microscope
CDN $115.00 Add to cart
