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ICS:71.040.40
Showing 118–126 of 126 results
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ISO 14187:2020 Surface chemical analysis – Characterization of nanostructured materials
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ISO 16129:2018 Surface chemical analysis – X-ray photoelectron spectroscopy – Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
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ISO 14701:2018 Surface chemical analysis – X-ray photoelectron spectroscopy – Measurement of silicon oxide thickness
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ISO 16531:2020 Surface chemical analysis – Depth profiling – Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
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ISO 3165:1976 Sampling of chemical products for industrial use – Safety in sampling
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ISO 6145:2017 Gas analysis – Preparation of calibration gas mixtures using dynamic methods – Part 6: Critical flow orifices
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ISO 6141:2020 Gas analysis – Contents of certificates for calibration gas mixtures – Amendment 1: Cross reference list to ISO Guide 31:2015 and ISO/IEC 17025:2017
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ISO 29041:2009 Gas mixtures – Gravimetric preparation – Mastering correlations in composition – Technical Corrigendum 1
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ISO 14912:2006 Gas analysis – Conversion of gas mixture composition data – Technical Corrigendum 1
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