ICS:71.040.40
Showing 118–126 of 126 results
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ISO 23124:2024 Surface chemical analysis – Measurement of lateral and axial resolutions of a Raman microscope
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ISO 14187:2020 Surface chemical analysis – Characterization of nanostructured materials
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ISO 16129:2018 Surface chemical analysis – X-ray photoelectron spectroscopy – Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
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ISO 14701:2018 Surface chemical analysis – X-ray photoelectron spectroscopy – Measurement of silicon oxide thickness
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ISO 14706:2014 Surface chemical analysis – Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
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ISO 18337:2015 Surface chemical analysis – Surface characterization – Measurement of the lateral resolution of a confocal fluorescence microscope
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ISO 18507:2015 Surface chemical analysis – Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
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ISO 29041:2009 Gas mixtures – Gravimetric preparation – Mastering correlations in composition – Technical Corrigendum 1
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ISO 14912:2006 Gas analysis – Conversion of gas mixture composition data – Technical Corrigendum 1
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